Effect of semicon-dielectric interface on conductivity and electric field distribution

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 9, Issue 4, 2002, Pages 596-603

  Hjerrild, Jesper ^a,d   Holboll, Joachim ^a   Henriksen, Mogens ^a   Boggs, Steven ^a,b,c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF CONNECTICUT   (United States)

^c UNIVERSITY OF TORONTO   (Canada)

^d NKT Research & Innovation AS   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD DISTORTION; ELECTRIC FIELD DISTRIBUTION; SEMICON-DIELECTRIC INTERFACE; SEMICONDUCTING ELECTRODE; SPACE CHARGE MEASUREMENT;

APPROXIMATION THEORY; COMPUTATIONAL METHODS; DIELECTRIC PROPERTIES; ELECTRIC CHARGE MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC DISTORTION; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRODES; INTERFACES (MATERIALS); SEMICONDUCTOR MATERIALS;

DIELECTRIC MATERIALS;

EID: 0036692742     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2002.1024438     Document Type: Article

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