Quantitative analysis of microstructural homogeneity and capacitance correlations in palladium/yttria-stabilized zirconia composites

Journal of the American Ceramic Society

Volumn 85, Issue 8, 2002, Pages 2097-2101

  Hendriks, Mark G H M ^a   Heijman, Marjan J G W ^a   Van Zyl, Werner E ^a   Ten Elshof, Johan E ^a   Verweij, Henk ^b,c  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b The Ohio State University   (United States)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CORRELATION METHODS; CRYSTAL MICROSTRUCTURE; IMAGE ENHANCEMENT; INSULATING MATERIALS; YTTRIUM COMPOUNDS; ZIRCONIA;

DUAL-PHASE COMPOSITES; MICROSTRUCTURAL HOMOGENEITY;

COMPOSITE MATERIALS;

EID: 0036687570     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00410.x     Document Type: Article

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