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Volumn 37, Issue 15, 2002, Pages 3225-3228

Mechanism of resistance degradation of lead magnesium niobate-based ferroelectrics induced by hydrogen reduction during electroplating

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEGRADATION; ELECTROPLATING; FERROELECTRIC MATERIALS; OXIDATION; REDUCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036685916     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016122714820     Document Type: Article
Times cited : (6)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.