Dispersion measurement of tapered air–silica microstructure fiber by white-light interferometry

Applied Optics

Volumn 41, Issue 22, 2002, Pages 4467-4470

  Ye, Qinghao ^a   Xu, Chris ^b   Liu, Xiang ^b   Knox, Wayne H ^b,c   Yan, Man F ^b   Windeler, Robert S ^b   Eggleton, Benjamin ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTROMAGNETIC DISPERSION; INTERFEROMETRY; MICROSTRUCTURE; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SILICA; ULTRAVIOLET RADIATION;

WHITE-LIGHT INTERFEROMETRY;

OPTICAL FIBERS;

EID: 0036685402     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.004467     Document Type: Article

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