A cryogenic scanning near-field optical microscope with shear-force gapwidth control

Review of Scientific Instruments

Volumn 73, Issue 8, 2002, Pages 2937-

  Kramer, A ^a   Segura, J M ^a   Hunkeler, A ^a   Renn, A ^a   Hecht, B ^a  

^a ETH ZURICH   (Switzerland)

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EID: 0036685001     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1491028     Document Type: Article

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