A laser ablation electron impact ionization time-of-flight mass spectrometer for analysis of condensed materials

Review of Scientific Instruments

Volumn 73, Issue 8, 2002, Pages 3003-3006

  Drewnick, F ^a   Wieser, P H ^a  

^a UNIVERSITY OF HOHENHEIM   (Germany)

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EID: 0036684963     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1490419     Document Type: Article

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