-
2
-
-
0030677059
-
High-density recording mechanism of magnetooptical disks
-
T. Maeda, “High-density recording mechanism of magnetooptical disks,” Jpn. J. Appl. Phys. 36, 504-513 (1997).
-
(1997)
Jpn. J. Appl. Phys.
, vol.36
, pp. 504-513
-
-
Maeda, T.1
-
3
-
-
0030672295
-
Thermal response design for high recording density magneto-optical media
-
T. Abiko, A. Konishi, M. Kagawa, and S. Igarashi, “Thermal response design for high recording density magneto-optical media,” Jpn. J. Appl. Phys. 36, 410-413 (1997).
-
(1997)
Jpn. J. Appl. Phys.
, vol.36
, pp. 410-413
-
-
Abiko, T.1
Konishi, A.2
Kagawa, M.3
Igarashi, S.4
-
4
-
-
0010039503
-
Estimation of thermal conductivity of magneto-optic media
-
X. Xun, C. Peng, and M. Mansuripur, “Estimation of thermal conductivity of magneto-optic media,” Appl. Opt. 39, 4355-4360 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 4355-4360
-
-
Xun, X.1
Peng, C.2
Mansuripur, M.3
-
5
-
-
0009966521
-
Calorimetric studies of the heat capacity and relaxation of amorphous Si prepared by electron beam evaporation
-
K. H. Tsang, H. W. Kui, and K. P. Chik, “Calorimetric studies of the heat capacity and relaxation of amorphous Si prepared by electron beam evaporation,” J. Appl. Phys. 74, 4932-4935 (1993).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 4932-4935
-
-
Tsang, K.H.1
Kui, H.W.2
Chik, K.P.3
-
6
-
-
0345528706
-
Nanocalorimeter for high resolution measurements of low temperature heat capacities of thin films and single crystals
-
F. Fominaya, T. Fournier, P. Gandit, and J. Chaussy, “Nanocalorimeter for high resolution measurements of low temperature heat capacities of thin films and single crystals,” Rev. Sci. Instrum. 68, 4191-4195 (1997).
-
(1997)
Rev. Sci. Instrum.
, vol.68
, pp. 4191-4195
-
-
Fominaya, F.1
Fournier, T.2
Gandit, P.3
Chaussy, J.4
-
7
-
-
36449004171
-
Thin film microcalorimeter for heat capacity measurements from 1.5 to 800 K
-
D. W. Denlinger, E. N. Abarra, K. Allen, P. W. Rooney, M. T. Messer, S. K. Watson, and F. Hellman, “Thin film microcalorimeter for heat capacity measurements from 1.5 to 800 K,” Rev. Sci. Instrum. 65, 946-959 (1994).
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 946-959
-
-
Denlinger, D.W.1
Abarra, E.N.2
Allen, K.3
Rooney, P.W.4
Messer, M.T.5
Watson, S.K.6
Hellman, F.7
-
8
-
-
0019009771
-
Heat capacity cryostat and novel methods of analysis for small specimens in the 1.5-10-K range
-
E. M. Forgan and S. Nedjat, “Heat capacity cryostat and novel methods of analysis for small specimens in the 1.5-10-K range,” Rev. Sci. Instrum. 51, 411-417 (1980).
-
(1980)
Rev. Sci. Instrum.
, vol.51
, pp. 411-417
-
-
Forgan, E.M.1
Nedjat, S.2
-
9
-
-
0033452168
-
A phase-sensitive technique for the thermal characterization of dielectric thin films
-
S. W. Indermuehle and R. B. Peterson, “A phase-sensitive technique for the thermal characterization of dielectric thin films,” Trans. ASME 121, 528-536 (1999).
-
(1999)
Trans. ASME
, vol.121
, pp. 528-536
-
-
Indermuehle, S.W.1
Peterson, R.B.2
-
10
-
-
0032304693
-
Analysis of high-order harmonics of temperature wave for Fourier transform thermal analysis
-
J. Morikawa and T. Hashimoto, “Analysis of high-order harmonics of temperature wave for Fourier transform thermal analysis,” Jpn. J. Appl. Phys. 37, Part 2, L1485-L1487 (1998).
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, pp. L1485-L1487
-
-
Morikawa, J.1
Hashimoto, T.2
-
11
-
-
0001764219
-
Photoacoustic determination of thin film thermal properties
-
R. T. Swimm, “Photoacoustic determination of thin film thermal properties,” Appl. Phys. Lett. 42, 955-957 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.42
, pp. 955-957
-
-
Swimm, R.T.1
-
12
-
-
57849094077
-
Overview of photothermal characterization of optical thin film coatings
-
H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newman, andM. J. Soileau, eds., Proc. SPIE 2714
-
Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Overview of photothermal characterization of optical thin film coatings,” in 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, H. E. Bennett, A. H. Guenther, M. R. Kozlowski, B. E. Newman, andM. J. Soileau, eds., Proc. SPIE 2714, 465-481 (1996).
-
(1996)
27Th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
, pp. 465-481
-
-
Wu, Z.L.1
Thomsen, M.2
Kuo, P.K.3
Lu, Y.S.4
Stolz, C.5
Kozlowski, M.6
-
13
-
-
0001292732
-
Transient thermoreflectance from thin metal films
-
C. A. Paddock and G. L. Eesley, “Transient thermoreflectance from thin metal films,” J. Appl. Phys. 60, 285-290 (1986).
-
(1986)
J. Appl. Phys.
, vol.60
, pp. 285-290
-
-
Paddock, C.A.1
Eesley, G.L.2
-
14
-
-
0000881998
-
Thermal-conductivity measurements of GaAs/ AlAs superlattices using a picosecond optical pump-and-probe technique
-
W. S. Capinski, H. J. Maris, T. Ruf, M. Cardona, K. Ploog, and D. S. Katzer, “Thermal-conductivity measurements of GaAs/ AlAs superlattices using a picosecond optical pump-and-probe technique,” Phys. Rev. B 59, 8105-8113 (1999).
-
(1999)
Phys. Rev. B
, vol.59
, pp. 8105-8113
-
-
Capinski, W.S.1
Maris, H.J.2
Ruf, T.3
Cardona, M.4
Ploog, K.5
Katzer, D.S.6
-
15
-
-
0020102117
-
Laser-induced local heating of multilayer
-
M. Mansuripur, G. A. N. Connell, and J. W. Goodman, “Laser-induced local heating of multilayer,” Appl. Opt. 21,1106-1114 (1982).
-
(1982)
Appl. Opt.
, vol.21
, pp. 1106-1114
-
-
Mansuripur, M.1
Connell, G.A.N.2
Goodman, J.W.3
-
17
-
-
0031094212
-
Thermal characterization of surface-micromachined silicon nitride membranes for thermal infrared detectors
-
P. Eriksson, J. Y. Anderson, and G. Stemme, “Thermal characterization of surface-micromachined silicon nitride membranes for thermal infrared detectors,” J. Microelectromech. Syst. 6, 55-61 (1997).
-
(1997)
J. Microelectromech. Syst.
, vol.6
, pp. 55-61
-
-
Eriksson, P.1
Anderson, J.Y.2
Stemme, G.3
-
18
-
-
0343635648
-
Thermal conductivity and diffusivity of free-standing silicon nitride thin films
-
X. Zhang and C. P. Grigoropoulos, “Thermal conductivity and diffusivity of free-standing silicon nitride thin films,” Rev. Sci. Instrum. 66, 1115-1120 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 1115-1120
-
-
Zhang, X.1
Grigoropoulos, C.P.2
|