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Volumn 372-376, Issue PART 1, 2002, Pages 478-481
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Measured quality factor and intermodulation product of CPW resonators on silicon substrates with 100 nm wide niobium lines at 17 GHz and 4.2 K
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Author keywords
Microwave; Nanoline; Nb; Resonators
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Indexed keywords
ELECTRIC CONDUCTORS;
ELECTRIC IMPEDANCE;
INTERMODULATION;
MICROWAVES;
NATURAL FREQUENCIES;
NIOBIUM;
RESONATORS;
SILICON WAFERS;
SUBSTRATES;
WAVEGUIDES;
SUPERCONDUCTING RESONATORS;
SUPERCONDUCTING DEVICES;
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EID: 0036683687
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(02)00726-8 Document Type: Conference Paper |
Times cited : (1)
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References (3)
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