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Volumn 372-376, Issue PART 1, 2002, Pages 478-481

Measured quality factor and intermodulation product of CPW resonators on silicon substrates with 100 nm wide niobium lines at 17 GHz and 4.2 K

Author keywords

Microwave; Nanoline; Nb; Resonators

Indexed keywords

ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE; INTERMODULATION; MICROWAVES; NATURAL FREQUENCIES; NIOBIUM; RESONATORS; SILICON WAFERS; SUBSTRATES; WAVEGUIDES;

EID: 0036683687     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)00726-8     Document Type: Conference Paper
Times cited : (1)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.