Bit error rate experiments with RSFQ circuits realized in SINIS technology

Physica C: Superconductivity and its Applications

Volumn 372-376, Issue PART 1, 2002, Pages 136-138

  Khabipov, M ^a   Balashov, D ^a   Buchholz, F Im ^a   Niemeyer, J ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Digital integrated circuits; Josephson junctions; Rapid single flux quantum pulse logic

Indexed keywords

BIT ERROR RATE; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; JOSEPHSON JUNCTION DEVICES; QUANTUM THEORY; SWITCHING CIRCUITS;

RAPID SINGLE FLUX QUANTUM (RSFQ) CIRCUITS;

MIM DEVICES;

EID: 0036683659     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)00636-6     Document Type: Conference Paper

References (17)