Testing process performance based on the yield: An application to the liquid-crystal display module

Microelectronics Reliability

Volumn 42, Issue 8, 2002, Pages 1235-1241

  Chen, Jann Pygn ^a   Pearn, W L ^b  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAM LISTINGS; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT MANUFACTURE; LIQUID CRYSTAL DISPLAYS; STATISTICAL PROCESS CONTROL; STATISTICAL TESTS;

PROCESS CAPABILITY INDICES;

MICROELECTRONICS;

EID: 0036681881     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00081-1     Document Type: Article

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