|
Volumn 488, Issue 1-2, 2002, Pages 85-93
|
Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics
a b a a a a c d e e f a e d g h a g i a more..
g
CERN
(Switzerland)
|
Author keywords
CMS tracker; Radiation damage; Silicon microstrip detectors
|
Indexed keywords
COLLIDING BEAM ACCELERATORS;
ELECTRIC CONDUCTIVITY;
IRRADIATION;
MICROSTRIP DEVICES;
RADIATION DAMAGE;
READOUT SYSTEMS;
SIGNAL TO NOISE RATIO;
SILICON;
SUBSTRATES;
SILICON MICROSTRIP DETECTORS;
PARTICLE DETECTORS;
|
EID: 0036680481
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(02)00267-X Document Type: Article |
Times cited : (3)
|
References (12)
|