Better foldover fractions for resolution III 2k-p design

Technometrics

Volumn 44, Issue 3, 2002, Pages 278-283

  Li, Huo ^a   Mee, Robert W ^b  

^a BIOGEN   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

Design augmentation; Erasure; Minimal design; Minimum aberration; Word length pattern

Indexed keywords

COMBINATORIAL MATHEMATICS; ESTIMATION;

DESIGN AUGMENTATION;

STATISTICAL METHODS;

EID: 0036679196     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/004017002188618464     Document Type: Article

References (4)

1. Binary codes and caps
2. A catalogue of two-level and three-level fractional factorial designs with small runs
3. Connections between two-level designs of resolutions III and V