SCOPUS 정보 검색 플랫폼

Superconductor Science and Technology

Volumn 15, Issue 8, 2002, Pages 1268-1274

Electric resistance relaxation and oxygen diffusion in melt-texture grown YBCO bulk post-annealed at high temperature

(5) Zhang, H a,b Ye, H a Du, K a Huang, X Y a Wang, Z H b

a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

b NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL GROWTH FROM MELT; CRYSTAL MICROSTRUCTURE; DIFFUSION IN SOLIDS; ELECTRIC RESISTANCE; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; OXYGEN; STOICHIOMETRY; SUPERCONDUCTING TRANSITION TEMPERATURE;

ELECTRIC RESISTANCE RELAXATION; OXYGEN CONTENT; OXYGEN DIFFUSION;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0036677543 PISSN: 09532048 EISSN: None Source Type: Journal
DOI: 10.1088/0953-2048/15/8/317 Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.