Choice of optimal blocking schemes in two-level and three-level designs

Technometrics

Volumn 44, Issue 3, 2002, Pages 269-277

  Cheng, Shao Wei ^a   Wu, C F Jeff ^a  

^a INSTITUTE OF STATISTICAL SCIENCE   (Taiwan)

Author keywords

Defining contrast subgroup; Minimum aberration; Wordlength pattern

Indexed keywords

CALCULATIONS; ESTIMATION; STANDARDS;

OPTIMAL BLOCKING SCHEMES;

STATISTICAL METHODS;

EID: 0036677431     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017002188618455     Document Type: Article

References (16)

1. Minimum-aberration two-level fractional factorial split-plot designs
2. k-p designs
3. k-p designs
4. n-m designs
5. Fractional factorial experiment designs for factors at throe levels
6. Construction of a set of 512-run designs of resolution ≥ 5 and a set of even 1024-run designs of resolution ≥ 6
7. k-p designs
8. Fractional factorial experiment designs for factors at two levels
9. Some useful compound dispersion experiments in quality design
10. n-k designs
11. n-p designs
12. Minimum aberration designs with two-level and four-level factors