Structural characterization of high-pressure C-Na2Si2O5 by single-crystal diffraction and 29Si MAS NMR

Physics and Chemistry of Minerals

Volumn 29, Issue 7, 2002, Pages 477-484

  Rakic S ^a   Kahlenberg, V ^a   Weidenthaler, C ^b   Zibrowius, B ^b  

^a UNIVERSITY OF BREMEN   (Germany)

^b MAX PLANCK INSTITUT FÜR KOHLENFORSCHUNG   (Germany)

Author keywords

29Si MAS NMR; C Na2Si2O5; Phyllosilicate; Single crystal structure analysis; Single layer silicate; Sodium disilicate; Twinning

Indexed keywords

CRYSTAL STRUCTURE; HIGH PRESSURE; PHYLLOSILICATE; SILICATE; TWINNING;

EID: 0036675893     PISSN: 03421791     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00269-002-0259-1     Document Type: Article

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