Depth profiling of near-surface information in a functionally graded alumina/aluminium titanate composite using grazing-incidence synchrotron radiation diffraction

Materials Letters

Volumn 55, Issue 5, 2002, Pages 344-349

  Singh, M ^a   Manurung, P ^a   Low, I M ^a  

^a CURTIN UNIVERSITY   (Australia)

Author keywords

Alumina; Aluminium titanate; Depth profiling; Functionally graded; Grazing incidence synchrotron radiation; Phase abundance

Indexed keywords

ALUMINA; DIFFRACTION; FUNCTIONALLY GRADED MATERIALS; REFLECTION; STRAIN; SYNCHROTRON RADIATION; THERMAL EXPANSION;

DEPTH PROFILING;

PHASE COMPOSITION;

EID: 0036673866     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)00390-7     Document Type: Article

References (16)