SCOPUS 정보 검색 플랫폼

Particle and Particle Systems Characterization

Volumn 19, Issue 4, 2002, Pages 269-276

Analysis of adhesion forces between particles and wall based on the vibration method

(4) Hein, Konrad a Hucke, Thomas a Stintz, Michael a Ripperger, Siegfried a

a DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

Adhesion; Nanoscale; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; NUMERICAL METHODS; PARTICLES (PARTICULATE MATTER); SURFACE ROUGHNESS; VAN DER WAALS FORCES; VIBRATIONS (MECHANICAL);

ADHESION FORCE; NANOSCALE;

ADHESION;

EID: 0036671952 PISSN: 09340866 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4117(200208)19:4<269::AID-PPSC269>3.0.CO;2-T Document Type: Article

Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.