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Volumn 415, Issue 1-2, 2002, Pages 53-56
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Role of incorporated hydrogen in non-stoichiometric photo-deposited silicon nitride films
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Author keywords
Deposition process; Fourier transform infrared spectroscopy (FTIR); Hydrogen; Silicon nitride
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Indexed keywords
CARRIER CONCENTRATION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HYDROGEN;
IRRADIATION;
SILICON NITRIDE;
VAPOR DEPOSITION;
PHOTOCHEMICAL VAPOR DEPOSITION;
THIN FILMS;
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EID: 0036671495
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(02)00542-4 Document Type: Article |
Times cited : (10)
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References (12)
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