Anomalous electro-migration of oxygen vacancies in reduced TiO2

Solid State Communications

Volumn 123, Issue 9, 2002, Pages 399-404

  Miyaoka, Hideharu ^a,b   Mizutani, Goro ^a   Sano, Haruyuki ^a   Omote, Miki ^a   Nakatsuji, Kan ^b   Komori, Fumio ^b  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

A. Semiconductors; C. Point defects; D. Ionic transport

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRODES; POINT DEFECTS; SEMICONDUCTOR MATERIALS; TITANIUM DIOXIDE;

IONIC TRANSPORT;

ELECTROMIGRATION;

EID: 0036670909     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00349-6     Document Type: Article

References (11)