Dynamic recrystallization-induced flow phenomena in tungsten-tantalum (4%) [001] single-crystal rod ballistic penetrators

Materials Characterization

Volumn 48, Issue 5, 2002, Pages 407-421

  Trillo, E A ^a   Esquivel, E V ^a   Murr, L E ^a   Magness, L S ^b  

^a UNIVERSITY OF TEXAS AT EL PASO   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Dynamic recrystallization; Microstructure; SAED; TEM; Tungsten tantalum penetrator

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEFORMATION; METALLOGRAPHIC MICROSTRUCTURE; MICROHARDNESS; RECRYSTALLIZATION (METALLURGY); SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE-CRYSTAL ROD BALLISTIC PENETRATORS;

TUNGSTEN ALLOYS;

EID: 0036662670     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(02)00322-4     Document Type: Article

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