Conductivity measurement of electrospun PAN-based carbon nanofiber

Journal of Materials Science Letters

Volumn 21, Issue 13, 2002, Pages 1055-1057

  Wang, Yu ^a   Serrano, S ^a   Santiago Aviles, J J ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FIBERS; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC RESISTANCE MEASUREMENT; ELECTROMAGNETIC FIELD EFFECTS; EVAPORATION; HEATING; LITHOGRAPHY; MIXTURES; SURFACE TENSION; THERMAL EFFECTS;

CARBON NANOFIBER; ELECTROMETER; ELECTROSPINNING; POLYANILINE; POTENTIAL DIFFERENCE; VACUUM EVAPORATION;

NANOSTRUCTURED MATERIALS;

EID: 0036649667     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016081212346     Document Type: Article

References (7)