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Volumn 4, Issue 7, 2002, Pages 478-482
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Sample controlled reaction temperature (SCRT): Controlling the phase composition of silicon nitride obtained by carbothermal reduction
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Author keywords
[No Author keywords available]
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Indexed keywords
CREEP;
ELECTRIC INSULATION;
HARDNESS;
MICROSTRUCTURE;
OXIDATION;
PHASE COMPOSITION;
PYROLYSIS;
SYNTHESIS (CHEMICAL);
TOUGHNESS;
CARBOTHERMAL REDUCTION;
THERMAL SHOCK;
SILICON NITRIDE;
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EID: 0036647992
PISSN: 14381656
EISSN: None
Source Type: Journal
DOI: 10.1002/1527-2648(20020717)4:7<478::AID-ADEM478>3.0.CO;2-P Document Type: Article |
Times cited : (13)
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References (37)
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