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Volumn 4, Issue 7, 2002, Pages 478-482

Sample controlled reaction temperature (SCRT): Controlling the phase composition of silicon nitride obtained by carbothermal reduction

Author keywords

[No Author keywords available]

Indexed keywords

CREEP; ELECTRIC INSULATION; HARDNESS; MICROSTRUCTURE; OXIDATION; PHASE COMPOSITION; PYROLYSIS; SYNTHESIS (CHEMICAL); TOUGHNESS;

EID: 0036647992     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/1527-2648(20020717)4:7<478::AID-ADEM478>3.0.CO;2-P     Document Type: Article
Times cited : (13)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.