A general small-signal series impedance extraction technique

IEEE Microwave and Wireless Components Letters

Volumn 12, Issue 7, 2002, Pages 249-251

  Vestling, Lars ^a   Ankarcrona, Johan ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

Equivalent circuits; Impedance measurement; Microwave transistors; Parameter estimation

Indexed keywords

APPROXIMATION THEORY; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC RESISTANCE; FINITE ELEMENT METHOD; INDUCTANCE; MATHEMATICAL MODELS; MOSFET DEVICES; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE;

CIRCUIT MODELS; MICROWAVE TRANSISTORS;

EQUIVALENT CIRCUITS;

EID: 0036647556     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2002.801134     Document Type: Article

References (7)

1. Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling
2. A four-step method for de-embedding gigahertz on-wafer CMOS measurements
3. Large-signal modeling of microwave transistors
4. Extracting small-signal model parameters of silicon MOSFET transistors
5. A novel approach to extracting small-signal model parameters of silicon MOSFETs
6. A CMOS compatible power MOSFET for low voltage GHz operation