Eye pattern evaluation in high-speed digital systems analysis by using MTL modeling

IEEE Transactions on Microwave Theory and Techniques

Volumn 50, Issue 7, 2002, Pages 1807-1815

  Antonini, Giulio ^a,b   Drewniak, James L ^a,c   Orlandi, Antonio ^a,b   Ricchiuti, Vittorio ^a,d  

^a IEEE   (Italy)

^b UNIVERSITY OF L'AQUILA   (Italy)

^c University of Missouri Rolla   (United States)

^d SIEMENS AG   (Germany)

Author keywords

Dielectric constant; Dissipation factor; Frequency dependent dielectric; Signal integrity

Indexed keywords

DIGITAL SYSTEMS; MULTICONDUCTOR TRANSMISSION LINES (MTL);

BANDWIDTH; COMPUTER SIMULATION; DIELECTRIC MATERIALS; NATURAL FREQUENCIES; PERMITTIVITY; PRINTED CIRCUIT BOARDS; TRANSMISSION LINE THEORY;

TELECOMMUNICATION SYSTEMS;

EID: 0036647249     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.800443     Document Type: Article

References (15)

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