Resistivity measurements of layered metallic films at various microwave frequencies and temperatures using the micro-strip T-junction method

Measurement Science and Technology

Volumn 13, Issue 7, 2002, Pages 1132-1137

  Liu, Jih Hsin ^a   Lin, Yi Chia ^a   Lue, Juh Tzeng ^a   Wu, Chien Jang ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

Micro strip; Microwave; Resonator; Surface resistance; T junction

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; MICROWAVES; NIOBIUM; NUMERICAL ANALYSIS; SILVER ALLOYS; SUPERCONDUCTING FILMS; THERMAL CONDUCTIVITY;

LOCALIZATION EFFECTS; SURFACE RESISTANCES;

METALLIC FILMS;

RESISTANCE;

EID: 0036646788     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/13/7/322     Document Type: Article

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