Effects of roughness on the retroreflection from dielectric layers

Waves Random Media

Volumn 12, Issue 3, 2002, Pages 279-292

  Blumberg, D G ^a   Freilikher, V ^a   Fuks, I ^a   Kaganovskii, Yu ^a   Maradudin, A A ^a   Rosenbluh, M ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHT INTERFERENCE; LIGHT MEASUREMENT; LIGHT POLARIZATION; LIGHT REFLECTION; MIRRORS; SURFACE ROUGHNESS;

DIELECTRIC LAYERS; INTERFERENCE PATTERN; RETROREFLECTION;

ELECTROMAGNETIC WAVE BACKSCATTERING;

EID: 0036646326     PISSN: 09597174     EISSN: None     Source Type: Journal    
DOI: 10.1088/0959-7174/12/3/302     Document Type: Article

References (12)

1. Lectures on the theory of light and colours
2. The GPR experiment on NETLANDER
3. Light scattering from slightly rough dielectric films
4. Radar observation of strong subsurface scatterers. Model of subsurface reflections
5. Radar observations of strong subsurface scatterers. A model of backscattering
6. Radar contrast polarization dependence on subsurface sensing
7. Wave diffraction by rough interfaces in an arbitrary plane-layered medium
8. Wave diffraction by a rough boundary of an arbitrary plane-layered medium