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Volumn 332, Issue 1-2, 2002, Pages 382-391

Effect of NiO scales on the creep behavior of Ni single crystals at 550 °C

Author keywords

18O diffusion tracer; Creep; Nickel single crystal; NiO scale; Periodic cracking

Indexed keywords

CRACK INITIATION; CREEP; CRYSTAL DEFECTS; CRYSTAL GROWTH; DEFORMATION; DIFFUSION; NICKEL COMPOUNDS; RELAXATION PROCESSES; STRESS ANALYSIS;

EID: 0036644842     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01921-9     Document Type: Article
Times cited : (10)

References (21)
  • 2
    • 84991425442 scopus 로고
    • Ph.D. thesis. University of Technology of Compiègne, Compiègne
    • (1985)
    • Aubry, A.1
  • 8
    • 84991412553 scopus 로고
    • Ph.D. thesis, Pierre et Marie Curie University, Paris
    • (1977)
    • Duong, P.1
  • 12
    • 84991417525 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Technology of Compiegne, Compiegne
    • (2000)
    • Vallino, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.