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Volumn 332, Issue 1-2, 2002, Pages 382-391
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Effect of NiO scales on the creep behavior of Ni single crystals at 550 °C
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Author keywords
18O diffusion tracer; Creep; Nickel single crystal; NiO scale; Periodic cracking
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Indexed keywords
CRACK INITIATION;
CREEP;
CRYSTAL DEFECTS;
CRYSTAL GROWTH;
DEFORMATION;
DIFFUSION;
NICKEL COMPOUNDS;
RELAXATION PROCESSES;
STRESS ANALYSIS;
PERIODIC CRACKING;
SINGLE CRYSTALS;
CREEP;
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EID: 0036644842
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5093(01)01921-9 Document Type: Article |
Times cited : (10)
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References (21)
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