Automated control of an actively compensated Langmuir probe system using simulated annealing

Knowledge-Based Systems

Volumn 15, Issue 5-6, 2002, Pages 349-354

  Nolle, L ^a   Goodyear, A ^a   Hopgood, A A ^b   Picton, P D ^c   Braithwaite, N St J ^a  

^a OPEN UNIVERSITY   (United Kingdom)

^b NOTTINGHAM TRENT UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF NORTHAMPTON   (United Kingdom)

Author keywords

Langmuir probe system; Optimisation; Simulated annealing

Indexed keywords

HARMONIC ANALYSIS; OPTIMIZATION; SIMULATED ANNEALING; WAVEFORM ANALYSIS;

LANGMUIR PROBE SYSTEMS;

CONTROL SYSTEM ANALYSIS;

EID: 0036643210     PISSN: 09507051     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0950-7051(01)00171-X     Document Type: Conference Paper

References (8)

1. Self bias of an r.f. driven probe in an r.f. plasma
2. Multiple harmonic compensation of Langmuir probes in rf discharges
3. Electrical characterization of radio frequency discharges in the gaseous electronics conference reference cell
4. Optimum finisher mill set-up in the hot rolling of wide steel strip using simulated annealing
5. Optimization by simulated annealing
6. Equation of state calculations by fast computing machines
7. Optimum work roll profile selection in the hot rolling of wide steel strip using computational intelligence