Experimental crack identification using electrical impedance tomography

NDT and E International

Volumn 35, Issue 5, 2002, Pages 301-316

  Lazarovitch, R ^a   Rittel, D ^a   Bucher, I ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Computational algorithm; Conductance; Homogeneous medium

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRODES; LAPLACE TRANSFORMS; NONDESTRUCTIVE EXAMINATION; RESISTORS;

CRACK IDENTIFICATION;

CRACKS;

EID: 0036643112     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(01)00054-8     Document Type: Article

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