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Volumn 305, Issue 1-3, 2002, Pages 136-139

Dielectric characterization of the lone pair oxide structure

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARACTERIZATION; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; PHOTOCONDUCTIVITY; POLARIZATION; POSITIVE IONS;

EID: 0036642842     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)01090-6     Document Type: Conference Paper
Times cited : (16)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.