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Volumn 305, Issue 1-3, 2002, Pages 136-139
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Dielectric characterization of the lone pair oxide structure
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CHARACTERIZATION;
CRYSTAL STRUCTURE;
DIELECTRIC PROPERTIES;
DIELECTRIC RELAXATION;
PHOTOCONDUCTIVITY;
POLARIZATION;
POSITIVE IONS;
DIELECTRIC CHARACTERIZATION;
SEMICONDUCTING LEAD COMPOUNDS;
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EID: 0036642842
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(02)01090-6 Document Type: Conference Paper |
Times cited : (16)
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References (9)
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