Quality inspection of electroplated materials using planar type micro-magnetic sensors with post-processing from neural network model

IEE Proceedings: Science, Measurement and Technology

Volumn 149, Issue 4, 2002, Pages 165-171

  Mukhopadhyay, S C ^a  

^a MASSEY UNIVERSITY   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC IMPEDANCE; ELECTROMAGNETISM; NEURAL NETWORKS; PARAMETER ESTIMATION; SENSORS; VECTORS;

MICRO-MAGNETIC SENSORS;

ELECTROPLATING;

EID: 0036639744     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:20020340     Document Type: Conference Paper

References (22)

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