SCOPUS 정보 검색 플랫폼

Materials Transactions

Volumn 43, Issue 7, 2002, Pages 1537-1541

Current-voltage characteristics across small angle symmetric tilt boundaries in Nb-doped SrTio3 bicrystals

(4) Yamamoto, Takahisa a Oba, Fumiyasu a Ikuhara, Yuichi a Sakuma, Taketo a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

Bicrystal; Current voltage (I V) characteristic; Double Schottky barrier; Grain boundary structure; HRTEM; SrTiO3

Indexed keywords

CRYSTAL SYMMETRY; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); GRAIN BOUNDARIES; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

BICRYSTALS;

CRYSTALS;

EID: 0036631010 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.43.1537 Document Type: Conference Paper

Times cited : (10)

References (16)

1
- 0003957444
- Ellis Horwood New York
- (1994) Semiconductor ceramics
- Hozer, L.¹

2
- 0025465178
- (1990) J. Am. Ceram. Soc. , vol.73 , pp. 1817-1840
- Gupta, T.K.¹

3
- 0029308839
- (1995) J. Mater. Sci. , vol.30 , pp. 2463-2474
- Huybrecht, B.¹ Ishizaki, K.² Takata, M.³

4
- 0019032706
- (1980) J. Am. Ceram. Soc. , vol.63 , pp. 398-401
- Nemoto¹ Oda, I.²

5
- 0030173236
- (1996) J. Am. Ceram. Soc. , vol.79 , pp. 1669-1672
- Hayashi, K.¹ Yamamoto, T.² Sakuma, T.³

6
- 0030126111
- (1996) J. Am. Ceram. Soc. , vol.79 , pp. 997-1001
- Kuwabara, M.¹ Morimo, K.² Matsunaga, T.³

7
- 0000310206
- (1999) Key Engineering Materials , vol.157-158 , pp. 207-212
- Nomura, M.¹ Ichinose, N.² Haneda, H.³ Tanaka, J.⁴

8
- 0033357497
- (1999) Jpn. J. Appl. Phys. , vol.38 , pp. 5028-5032
- Ohashi, N.¹ Terada, Y.² Ohgaki, T.³ Tanaka, S.⁴ Tsummi, T.⁵ Fukunaga, O.⁶ Haneda, H.⁷ Tanaka, J.⁸

9
- 0033225964
- (1999) J. Am. Ceram. Soc. , vol.82 , pp. 3069-3074
- Nakamura, Y.¹ Harada, T.² Kuribara, H.³ Kishimoto, A.⁴ Motohira, N.⁵ Yanagida, H.⁶

10
- 0018469297
- (1979) J. Appl. Phys. , vol.50 , pp. 3414-3422
- Pike, G.E.¹ Seager, C.H.²

11
- 0001632606
- (1990) Phys. Rev. B , vol.42 , pp. 3644-3657
- Tarnow, E.¹ Dallot, P.² Bristowe, P.D.³

12
- 84984970865
- (1990) J. Am. Ceram. Soc. , vol.73 , pp. 3278-3285
- Chiang, Y.M.¹ Takagi, T.²

13
- 0004236762
- (1996) Philips Res. Rep. , vol.31 , pp. 554-559
- Daniel, J.¹ Wermicke, R.²

14
- 0035572931
- (2001) J. Electron. Microscopy , vol.50 , pp. 485-488
- Yamamoto, T.¹ Ikuhara, Y.²

15
- 0005304806
- (2000) Ceramic Transactions , vol.118 , pp. 207-214
- Yamamoto, T.¹ Ikuhara, Y.² Hayashi, K.³ Sakuma, T.⁴

16
- 0005325486
- Dislocation models for interfaces
- ed. A. P. Sutton and R. W. Balluffi, Clarendon Press, Oxford
- (1995) Interfaces in Crystalline Materials , pp. 70-96
- Sutton, A.P.¹ Balluffi, R.W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.