Critical point and vapor pressure measurements for nine compounds by a low residence time flow method

Journal of Chemical and Engineering Data

Volumn 47, Issue 4, 2002, Pages 761-764

  Wilson, Grant M ^a   VonNiederhausern, David M ^a   Giles, Neil F ^a  

^a Wiltec Research Company Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL POINT MEASUREMENT; LOW RESIDENCE TIME FLOW METHOD; VAPOR PRESSURE MEASUREMENT;

CORRELATION METHODS; TEMPERATURE; THERMAL VARIABLES MEASUREMENT; VAPOR PRESSURE;

ORGANIC COMPOUNDS;

EID: 0036629280     PISSN: 00219568     EISSN: None     Source Type: Journal    
DOI: 10.1021/je0100995     Document Type: Article

References (11)

1. Critical point and vapor pressure measurements at high temperatures by means of a new apparatus with ultra-low residence times
2. Critical point measurements for nine compounds by a flow method
3. Critical point measurements for fourteen compounds by a static method and a flow method
4. Thermodynamic properties and ideal-gas enthalpies of formation for dicyclohexyl sulfide, diethylenetriamine, di-n-octyl sulfide, dimethyl carbonate, piperazine, hexachloroprop-1-ene, tetrakis(dimethylamino)ethylene, N,N′-bis(2-hydroxyethyl)-ethylenediamine, and 1,2,4-triazolo[1,5-α]pyrimidine
5. Vapor pressure of 13 pure industrial chemicals
6. Wyrzykowska-stankiewics experimental vapor pressures and maximum-likelihood antoine-equation constants for 1,1,1-methoxydimethylpropane, thiacyclopentane, and 1,4-butanediol
7. Production of low temperatures-a simplified and inexpensive laboratory procedure
8. Structural effects on critical properties B vapor pressure and critical property measurement
9. Some thermodynamic properties of systems containing propylene carbonate and ethylene carbonate