Advancements in codes for computer aided design of depressed collectors and tracing of backscattered electrons - Part II: Improvements in modeling of the physics of secondary electron emission and backscattering

IEEE Transactions on Plasma Science

Volumn 30, Issue 3 I, 2002, Pages 1271-1276

  Valfells, Ágúst ^a   Singh, Amarjit ^a   Kolander, Murray J ^a   Granatstein, Victor L ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Depressed collectors; Electron trajectories; Modeling; Secondary electron emission; Simulation

Indexed keywords

BACKSCATTERING; CODES (SYMBOLS); COMPUTER SIMULATION; ELECTRON EMISSION; MONTE CARLO METHODS; RANDOM PROCESSES;

ELECTRON BACKSCATTERING;

COMPUTER AIDED DESIGN;

EID: 0036627491     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2002.801640     Document Type: Article

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