Long-term hardware-related complications of deep brain stimulation

Neurosurgery

Volumn 50, Issue 6, 2002, Pages 1268-1276

  Oh, Michael Y ^a   Abosch, Aviva ^a   Kim, Seong H ^a   Lang, Anthony E ^a   Lozano, Andres M ^a,b   Benabid, Alim Louis ^c   Sharan, Ashwini D ^c   Rezai, Ali R ^c   Starr, Philip ^c   Bakay, Roy A E ^c  

^a UNIVERSITY HEALTH NETWORK   (Canada)

^b TORONTO WESTERN HOSPITAL   (Canada)

^c NONE

Author keywords

Adverse events; Deep brain stimulation; Hardware

Indexed keywords

ADULT; ARTICLE; BRAIN DEPTH STIMULATION; CANADA; ELECTRODE; EROSION; FEMALE; FOLLOW UP; FOREIGN BODY REACTION; HUMAN; INCIDENCE; INFECTION; LIQUORRHEA; MALE; MATERIALS; METAL IMPLANTATION; POSTOPERATIVE COMPLICATION; PRIORITY JOURNAL;

ADULT; AGED; BRAIN; CEREBRAL HEMORRHAGE; DEVICE REMOVAL; ELECTRIC STIMULATION THERAPY; ELECTRODES, IMPLANTED; EQUIPMENT FAILURE; FEMALE; FOLLOW-UP STUDIES; FOREIGN-BODY MIGRATION; HUMANS; HYPERSENSITIVITY; MALE; MIDDLE AGED; MOVEMENT DISORDERS; PAIN; PALLIATIVE CARE; RETROSPECTIVE STUDIES; SURGICAL WOUND INFECTION; TIME FACTORS;

EID: 0036626673     PISSN: 0148396X     EISSN: None     Source Type: Journal    
DOI: 10.1097/00006123-200206000-00017     Document Type: Article

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