Determining thin film parameters by prism coupling technique

Technical Physics Letters

Volumn 28, Issue 6, 2002, Pages 467-470

  Khomchenko, A V ^a   Sotsky, A B ^a   Romanenko, A A ^a   Glazunov, E V ^a   Kostyuchenko, D N ^a  

^a INSTITUTE FOR MATHEMATICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036624168     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1490962     Document Type: Article

References (7)

1. V.N. Sretenskii and V.A. Yudinov, Zarubezhn. Radioélektron., No. 3, 69 (1996).
2. R. Ulrich and R. Torge, Appl. Opt. 12 (12), 2901 (1973).
3. T.W. Hou and C.J. Mogab, Appl. Opt. 20 (18), 3184 (1981).
4. A.B. Sotskii, A.V. Khomchenko, and L.I. Sotskaya, Opt. Spektrosk. 78 (3), 502 (1995) [Opt. Spectrosc. 78, 453 (1995)].
5. A.A. Romanenko and A.B. Sotskii, Zh. Tekh. Fiz. 68 (4), 88 (1998) [Tech. Phys. 43, 427 (1998)].
6. G.T. Petrovskii, V.P. Red'ko, and A.V. Khomchenko, Zh. Tekh. Fiz. 54 (10), 2045 (1984) [Sov. Phys. Tech. Phys. 29, 1199 (1984)].
7. R.Th. Kersten, Vak.-Tech. 23 (1), 16 (1973).