Microwave dielectric characteristics of (1-x) (Al1/2Ta1/2)O2-xTiO2 ceramics

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 6 A, 2002, Pages 3804-3807

  Choi, Ji Won ^a,b   Yoon, Seok Jin ^a,b   Kim, Hyun Jai ^a,b   Yoon, Ki Hyun ^a,b  

^a Korea Institute of Science and Technology   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

Dielectric constant; Microwave dielectric materials; Quality factor; Temperature coefficient of resonant frequency; Tetragonal structure

Indexed keywords

ALUMINA; CRYSTALLOGRAPHY; DIELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PERMITTIVITY; POWDER METALS; SOLID STATE PHYSICS; SYNTHESIS (CHEMICAL); TITANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MICROWAVE DIELECTRIC MATERIAL; MICROWAVE DIELECTRIC PROPERTY; SOLID-STATE REACTION METHOD;

CERAMIC MATERIALS;

EID: 0036614840     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.3804     Document Type: Article

References (14)