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Volumn 41, Issue 6 B, 2002, Pages 4070-4073

Dynamics of mass-limited laser plasma targets as sources for extreme ultraviolet lithography

Author keywords

EUV lithography; Laser plasma; Water droplet target

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; INTERFEROMETRY; PHOTOLITHOGRAPHY; PLASMA DIAGNOSTICS; ULTRAVIOLET RADIATION;

EID: 0036614388     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4070     Document Type: Article
Times cited : (8)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.