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Volumn 41, Issue 6 B, 2002, Pages 4070-4073
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Dynamics of mass-limited laser plasma targets as sources for extreme ultraviolet lithography
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Author keywords
EUV lithography; Laser plasma; Water droplet target
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC FIELD EFFECTS;
INTERFEROMETRY;
PHOTOLITHOGRAPHY;
PLASMA DIAGNOSTICS;
ULTRAVIOLET RADIATION;
PLASMA EXPANSION;
LASER PRODUCED PLASMAS;
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EID: 0036614388
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.41.4070 Document Type: Article |
Times cited : (8)
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References (14)
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