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Volumn 93, Issue 6, 2002, Pages 516-522
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Kinetics of growth of intermetallics in the Cu-Sn system
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Author keywords
Concentration distance profile; Growth kinetics; Intermetallics in the Cu Sn system
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Indexed keywords
ANNEALING;
COMPOSITION;
COPPER ALLOYS;
DIFFUSION;
GROWTH (MATERIALS);
METALLOGRAPHIC MICROSTRUCTURE;
MICROANALYSIS;
OPTICAL MICROSCOPY;
PROBES;
REACTION KINETICS;
THICKNESS MEASUREMENT;
TIN ALLOYS;
CHEMICAL DIFFUSION;
CONCENTRATION-DISTANCE PROFILE;
ELECTRON PROBE MICROANALYZER;
INTERMETALLICS;
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EID: 0036611255
PISSN: 00443093
EISSN: None
Source Type: Journal
DOI: 10.3139/146.020516 Document Type: Article |
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Times cited : (13)
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References (16)
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