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Volumn 191, Issue 2, 2002, Pages 489-498
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Epitaxial growth and defect structures of quaterrylene studied using high resolution electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
GRAIN BOUNDARIES;
HIGH RESOLUTION ELECTRON MICROSCOPY;
MOLECULAR ORIENTATION;
ORGANIC COMPOUNDS;
VAPOR PHASE EPITAXY;
ORGANIC CRYSTALS;
THIN FILMS;
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EID: 0036610882
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(200206)191:2<489::AID-PSSA489>3.0.CO;2-M Document Type: Article |
Times cited : (9)
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References (20)
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