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Volumn 191, Issue 2, 2002, Pages 489-498

Epitaxial growth and defect structures of quaterrylene studied using high resolution electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; MOLECULAR ORIENTATION; ORGANIC COMPOUNDS; VAPOR PHASE EPITAXY;

EID: 0036610882     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200206)191:2<489::AID-PSSA489>3.0.CO;2-M     Document Type: Article
Times cited : (9)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.