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Physica Status Solidi (A) Applied Research

Volumn 191, Issue 2, 2002, Pages 633-642

Residual stress dependent optical properties of ZnI2 films

(2) Tyagi, P a Vedeshwar, A G a

a UNIVERSITY OF DELHI (India)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COMPRESSIVE STRESS; CRYSTALLINE MATERIALS; LIGHT ABSORPTION; MORPHOLOGY; RESIDUAL STRESSES; STOICHIOMETRY; ZINC COMPOUNDS;

SIZE DISTRIBUTION;

THIN FILMS;

EID: 0036610802 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/1521-396X(200206)191:2<633::AID-PSSA633>3.0.CO;2-L Document Type: Article

Times cited : (9)

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2
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3
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4
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6
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- Tyagi, P.¹ Vedeshwar, A.G.² Mehra, N.C.³

7
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- Tyagi, P.¹ Vedeshwar, A.G.²

8
- 0003680984
- McGraw-Hill, New York
- (1970) Handbook of Thin Film Technology
- Maissel, L.I.¹ Glang, R.²

9
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- (1966) Appl. Opt. , vol.5 , pp. 51
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10
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- Springer-Verlag, Berlin
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- Yu, P.Y.¹ Cardona, M.²

11
- 0003907461
- Kluwer Acad. Publ., Boston
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.