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Volumn 33, Issue 6, 2002, Pages 533-538
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Use of the absolute Auger parameter for vanadium in the study of the dielectric relaxation of cerium vanadate
a,d
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Author keywords
Auger parameter; Cerium vanadate; Lithium intercalation; XPS analysis
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
BINDING ENERGY;
CERIUM COMPOUNDS;
CHEMICAL ANALYSIS;
DIELECTRIC RELAXATION;
ELECTRON EMISSION;
ELECTRON ENERGY LEVELS;
LITHIUM;
PHOTOIONIZATION;
POLARIZATION;
REFRACTIVE INDEX;
SURFACE STRUCTURE;
AUGER EMISSION;
AUGER PARAMETER;
CERIUM VANADATE;
ELECTRONIC POLARIZABILITY;
LITHIUM INTERCALATION;
SURFACE ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 0036609680
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1416 Document Type: Article |
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Times cited : (7)
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References (12)
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