Characterization methods of epitaxial Sr2FeMoO6 thin films

Journal of Crystal Growth

Volumn 241, Issue 4, 2002, Pages 448-454

  Besse, M ^a,b   Pailloux, F ^a,b   Barthelemy A ^a,b   Bouzehouane, K ^a,b   Fert, A ^a,b   Olivier, J ^c   Durand, O ^c   Wyczisk, F ^c   Bisaro, R ^c   Contour, J P ^a,b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

A1. Characterization; A3. Laser epitaxy; B2. Magnetic materials

Indexed keywords

ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; MAGNETIC PROPERTIES; MICROSTRUCTURE; NUCLEATION; PULSED LASER DEPOSITION; STRONTIUM COMPOUNDS; SURFACE ROUGHNESS;

LASER EPITAXY;

THIN FILMS;

EID: 0036609578     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01285-X     Document Type: Article

References (12)