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Volumn 193, Issue 1-4, 2002, Pages 504-507
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High-resolution soft X-ray spectroscopy of 2.3 keV/u N7+ ions through a microcapillary target
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NTT CORPORATION
(Japan)
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Author keywords
Hollow atom; Microcapillary; Slow highly charged ion; X ray spectroscopy
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Indexed keywords
ELECTRON TRANSITIONS;
NANOTECHNOLOGY;
NITROGEN;
QUANTUM THEORY;
SPECTROMETERS;
TARGETS;
X RAY SPECTROSCOPY;
HIGHLY CHARGED IONS (HCI);
POSITIVE IONS;
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EID: 0036609333
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)00828-5 Document Type: Article |
Times cited : (11)
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References (23)
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