Quantitative layer analysis of single crystal surfaces by LEIS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 193, Issue 1-4, 2002, Pages 455-459

  Beikler, Robert ^a   Taglauer, Edmund ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

Alloys; Computer simulation; Ion scattering; LEIS; Surface composition; Surface structure

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; COPPER ALLOYS; ION BEAMS; SURFACE STRUCTURE;

LOW-ENERGY ION SCATTERING (LEIS);

SINGLE CRYSTALS;

EID: 0036608985     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00820-0     Document Type: Conference Paper

References (20)