Investigation of magnetic domain patterns on a thin film surface of La0.7Sr0.3MnO3 at various temperatures using magnetic force microscopy

Surface Science

Volumn 507-510, Issue , 2002, Pages 573-576

  Ma, Y R ^a   Chueh, C H ^b   Kuang, W L ^c   Liou, Y ^c   Yao, Y D ^c  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b FU JEN CATHOLIC UNIVERSITY   (Taiwan)

^c INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Atomic force microscopy; Magnetic films; Magnetic measurements; Sputter deposition

Indexed keywords

ATOMIC FORCE MICROSCOPY; LANTHANUM COMPOUNDS; MAGNETIC DOMAINS; SILICA; SILICON; SPUTTER DEPOSITION; SQUIDS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

SURFACE PATTERNS;

MAGNETIC THIN FILMS;

EID: 0036608714     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01311-0     Document Type: Conference Paper

References (11)