Use of a pattern recognition algorithm to obtain a parametrization of low-mode and high-mode plasma states

Physics of Plasmas

Volumn 9, Issue 6, 2002, Pages 2667-

  Deranian, R D ^a   Groebner, R J ^a   Pham, D T ^b  

^a GENERAL ATOMICS   (United States)

^b CARDIFF UNIVERSITY   (United Kingdom)

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EID: 0036607615     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1476000     Document Type: Article

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