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Volumn 149, Issue 6, 2002, Pages
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Preparation and characterization of Cu-doped p-CdTe films grown by cathodic electrodeposition
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CARRIER CONCENTRATION;
COPPER;
ELECTRODEPOSITION;
FILM GROWTH;
HALL EFFECT;
REFLECTOMETERS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR DOPING;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CATHODIC ELECTRODEPOSITION;
CRYSTALLINITY;
HOLE CONCENTRATION;
VAN DER PAUW METHOD;
SEMICONDUCTING CADMIUM TELLURIDE;
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EID: 0036607317
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1470660 Document Type: Article |
Times cited : (8)
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References (21)
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