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Volumn 43, Issue 3-5, 2002, Pages 291-296

Test bench for IRFPA based on CMT and microbolometer

Author keywords

CMT; Microbolometer; Performance; Spectral analysis; Testing

Indexed keywords

ARRAYS; BOLOMETERS; CMOS INTEGRATED CIRCUITS; PERFORMANCE; READOUT SYSTEMS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

EID: 0036606205     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(02)00154-8     Document Type: Article
Times cited : (6)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.