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Volumn 43, Issue 3-5, 2002, Pages 291-296
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Test bench for IRFPA based on CMT and microbolometer
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Author keywords
CMT; Microbolometer; Performance; Spectral analysis; Testing
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Indexed keywords
ARRAYS;
BOLOMETERS;
CMOS INTEGRATED CIRCUITS;
PERFORMANCE;
READOUT SYSTEMS;
SPECTRUM ANALYSIS;
SPURIOUS SIGNAL NOISE;
MICROBOLOMETER;
INFRARED DETECTORS;
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EID: 0036606205
PISSN: 13504495
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4495(02)00154-8 Document Type: Article |
Times cited : (6)
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References (6)
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