|
Volumn 73, Issue 2, 2002, Pages 125-130
|
Recovery of minority carrier lifetime in low-cost multicrystalline silicon
|
Author keywords
pcd; Gettering; Lifetime; Multicrystalline silicon
|
Indexed keywords
CHARGE CARRIERS;
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
PURIFICATION;
SILICON WAFERS;
SUBSTRATES;
MULTICRYSTALLINE SILICON;
SILICON SOLAR CELLS;
|
EID: 0036605282
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(01)00117-9 Document Type: Article |
Times cited : (37)
|
References (7)
|