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Volumn 73, Issue 2, 2002, Pages 125-130

Recovery of minority carrier lifetime in low-cost multicrystalline silicon

Author keywords

pcd; Gettering; Lifetime; Multicrystalline silicon

Indexed keywords

CHARGE CARRIERS; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; PURIFICATION; SILICON WAFERS; SUBSTRATES;

EID: 0036605282     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(01)00117-9     Document Type: Article
Times cited : (37)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.